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NoiseMeasurementandModelingSolutionByNC300andMeQLabPDAConfidentialandProprietary
OutlineIntroductionNoiseMeasurementbyNC300DataAnalysisandNoiseModelingbyMeQLabCircuitCharacterizationbyMeQLabConclusionPDAConfidentialandProprietary
LowFrequencyNoise–1/fCircuitsaremoresensitiveto1/fnoiseatadvancedprocessnodesesamust-haveSPECbydesignersVariabilityofNoisescaleswithprocessvariabilityNeedstomeasure“Corner”DesignrequiresaccuratenoisesimulationRequiresaccuratenoiseanditsstatisticalmodelingPDAConfidentialandProprietary3Multi-die/waferCurrentSolutionsareexpensiveandslow!
WhyDesignersWantNoise“Corner”LFnoisevariationincreasesatadvancedprocessnodes.CircuitssuchasVCOareverysensitivetonoisevariationsPDAConfidentialandProprietary4CR018WidebandNoiseModelforAMS/RFCMOSSimulation.M.T.Yang,etal.2007IEEERadioFrequencyIntegratedCircuitsSymposium
WorkFlowHighlightAfullflowofnoisefromwafermeasurementtocircuitcharacterization.Fast,accurate,andflexiblenoisemeasurement.Statisticaldataprocessingandanalysis.Cornerandstatisticalnoisemodeling.Supportspeccharacterizationandoptimizationforuserdefinedcircuits.PDAConfidentialandProprietaryNoiseMeasurementDataAnalysisNoiseModelingCircuitCharacterization
NoisespectrumDraincurrentTimedomaindataMosfetMosSOIBJTDiodeResisterNC300providesfastandreliablelowfrequencynoisemeasurementusingprobestationformodelingorPCM/ETpurpose.PDAConfidentialandProprietaryNoiseMeasurement
NC300KeySpecifications1.Fastspeed:10Xspeedupwiththesameaccuracy2.Compact:Integratebiasunite,DSA,savecostonSMUandSpectrumAnalyzer3.Lowcurrentnoisemeasurement:~10pA4.Multi-dieormulti-wafersupport5.DeviceoscillationreductionbysupportingG-S-Gprobing6.LowestSystemNoiseFloor(Sid):10-29(A2/Hz)7.Noisemodelingbuilt-in:
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