基于智能计算编程语言的通用智能芯片技术要求.pdfVIP

基于智能计算编程语言的通用智能芯片技术要求 1 范围 本文件规定了基于智能计算编程语言的通用智能芯片的相关技术要求和测试方法。 本文件适用于基于智能计算编程语言的通用智能芯片的设计、测试等过程。 2 规范性引用文件 下列文件中的内容通过文中的规范性引用而构成本文件必不可少的条款。其中，注日期的引用文件， 仅该日期对应的版本适用于本文件；不注日期的引用文件，其最新版本 （包括所有的修改单）适用于本 文件。 ANSI/ESDA/JEDECJS-001ESDA/JEDECJointStandardForElectrostaticDischargeSensitivity Testing- Human Body Model (HBM) - Component Level ANSI/ESDA/JEDECJS-002ESDA/JEDECJointStandardForElectrostaticDischargeSensitivity Testing- Charged Device Model (CDM) - Device Level JESD78E JEDEC STANDARD IC Latch-Up Test JESD22-A108C JEDEC STANDARD Temperature, Bias, and Operating Life JESD22-A110-B EIA/JEDEC STANDARD Test Method A110-B Highly-Accelerated Temperature and Humidity Stress Test (HAST) JESD22-A103C JEDEC STANDARD High Temperature Storage Life JESD22-A119A JEDEC STANDARD Low Temperature Storage Life JESD22-A104C JEDEC STANDARD Temperature Cycling JESD22-A118 JEDEC STANDARD Accelerated Moisture Resistance - Unbiased HAST IEC 62321-2 Determination of certain substances in electrotechnical products– Part 2: Disassembly,disjointment and mechanical sample preparation IEC62321-3-1Determinationofcertainsubstancesinelectrotechnicalproducts-Part3-1: Screening- Lead,mercury, cadmium, totalchromium and totalbromineusingX-ray fluorescence spectrometry IEC 62321-4 Determination of certain substances in electrotechnical products – Part 4: Mercury in polymers, metals and electronics by CV-AAS, CV-AFS, ICP-OES and ICP-MS IEC 62321-5 determination of Lead and Cadmium by ICP-OES IEC 62321-7-2 and IEC 62321-7-1 determination of Hexavalent Chromium by UV-Vis IEC 62321-6 determination of PBBs and PBDEs by GC-MS EN 14372 determination of Phthalates content by GC-MS PCI Express® Base Specification Revision 3.1a PCI Express® Architecture Link Layer and Transaction Layer Test Specification Revision 3.0