基于多特征模型模拟电路可测性指标分析方法.pdfVIP

学兔兔 第34卷 第4期 仪 器 仪 表 学 报 Vo1．34 No．4 2013年4月 Chinese Journal of Scientific Instrument Apr．2013 基于多特征模型模拟电路可测性指标分析方法术 龙 兵，王彩利，高 媛，田书林 (电子科技大学自动化工程学院 成都 611731) 摘 要：结合多信号模型与多特征分析方法，提出了一种新的模拟电路可测性指标分析方法——多特征模型分析方法。该方 法根据电路输出节点的阶跃响应波形，提取出多个特征信号，并将所有的特征形成一个特征向量，然后转换成故障一测试依赖矩 阵进行可测性指标分析。以双二阶低通滤波器电路为例，分别在电路参数名义值、故障值与容差变化情况下，对所提方法与传 统故障字典法进行可测性指标分析对比试验。仿真试验结果表明，提出的方法不仅需要测点少，故障检测率与隔离率很高，而 且适合于具有容差的模拟电路可测性指标分析。 关键词：模拟电路；容差；可测性指标；多特征模型；依赖矩阵 中图分类号：TN710 文献识别码：A 国家标准学科分类代码：510．8040 A testability index analysis method for analog circuits based on multi．feature model Long Bing，Wang Caili，Gao Yuan，Tian Shulin (School of Automation Engineering，University of Electronic Science and Technology of China，Chengdu 61 1 731，China) Abstract：Based on the multi．signal model and multi—feature analysis methods，a new testability index analysis meth— od for analog circuits：multi-feature model analysis method is proposed in this paper．Multi—feature signals can be ex— tracted according to the step response waveforms at the output points of the circuit．All the useful feature signals form a feature vector，which then is transformed into a fault-test dependency matrix for testability index analysis．Consider— ing the nominal values，fault values and tolerance changes of the circuit parameters，a biquad low—pass filter is used as an example to carry out comparison experiment of testability index analysis between the proposed method and the tra— ditional method based on fault dictionary．Simulation experiment results show that the proposed method requires fewer test points，and has higher fault detection rate(