《《3953vh Imation-IBM RDX-SATA Drive PG Realibility Post ICT-Time Zero Product evaluation》.pdf

3953vh, Imation/IBM, RDX-SATA Drive, PG Reliability, Post ICT-Time Zero, Product evaluation Dell CMFA Lab Analyst: Victor G. Hernandez Key word: Imation/IBM 1/16/2009 Dell Confidential 1 Statement of work • Conduct visual examination of connector J9 J11 and DP on BGA U2 and U6 on 3 of the 6 provided samples. • Place 3 samples on hold pending cross section if warranted. 1/16/2009 Dell Confidential 2 Sample • 6 – IO Interconnect – RDX-SATA Drive cards, Post ICT-Time Zero - Sample ID#1 – 5083370038 DP - Sample ID#2 – 5083370039 DP - Sample ID#3 – 5083370041 DP - Sample ID#4 – 5083370037 Pending - Sample ID#5 – 5083370040 Pending - Sample ID#6 – 5083370042 Pending - GLF-CO50-269-001 Rev: 1.1 - 100241 Rev: E - Date Code: 0845 1/16/2009 Dell Confidential 3 Summary Visual: • Flux residue accumulation was observed between leads and at the edge of the board on the PWB copper pads for connectors J9 J11. • Droplets of flux were observed on the plastic housing of connector J9. • The gold finger wipe zone is contaminated with flux residue on J9 connector. 1/16/2009 Dell Confidential 4 Summary Dye Pry: • The U6 BGA device for all 3 DP samples exhibited Type 4 laminate separation with visible red dye stains. • Corner solder bump location t1 and t16 was common on all three samples